Tektronix has introduced a series of programmable pattern generators and bit error detectors with up to four channels for optical and serial data-communications testing on signals as fast as 32 Gbps. The PPG3000 series of pattern generators and PED3000 series of bit error detectors provide multichannel pattern generation with channel-specific data programming, allowing engineers to perform critical margin testing on standards like 100G Ethernet.

For testing coherent optical modulation formats, such as DP-QPSK, the PPG3000 pattern generator with its four phase-aligned channels can be used in conjunction with the Tektronix OM4000 coherent lightwave signal analyzer to validate coherent modulation formats in real time. For BER (bit error rate) testing, the PED3000 error detector can be teamed with the PPG3000 to provide up to 32-Gbps BER analysis with multichannel support for quick identification of crosstalk issues common in multilane data-communications architectures.

The PPG3000 series comprises six models, including generators with 30-Gbps or 32-Gbps speeds and one, two, or four channels. Available with either one or two channels, the PED3000 series of error detectors enables stressed receiver testing of multichannel data communications designs. These detectors combine sensitivity of less than 20 mV measured at 30 Gbps with data rates ranging from 32 Mbps to 32 Gbps.

Both the PPG3000 series of pattern generators and the PED3000 series of error detectors will be available in late December. Prices start at $85,000.

PPG3000 pattern generators: www.tek.com/bit-error-rate-tester/ppg3000-programmable-pattern-generator

PED3000 bit error detectors: www.tek.com/bit-error-rate-tester/ped3000-programmable-error-detector